The instruments used in our working group for MS analyses have the following specifications:

Specifications
Impact II Bruker Daltonics
max. Resolution 50 000 (65 000 with focus)
Scan range 50-20 000 m/z
Scan rate 1-50 Hz (MS & MS/MS)
Accuracy < 1-2 ppm (RMS) error with internal calibration
Fragmentation CID
   
MicrOTOF Bruker Daltonics
max. Resolution 16 500 FWHM with micrOTOF focus
Scan range 50 – 20 000 m/z
Scan rate < 40 Hz (100-3000 m/z profile mass spectra to disk)
Accuracy < 1-2 ppm (RMS) error with internal calibration
   
Microflex LRF Bruker Daltonics
max. Resolution 15 000
Scan range up to 300 000 m/z
Accuracy 15 ppm with internal Calibration
Laser Nitrogen 337 nm
Laser frequency 1.5-60 Hz
   
Esquire 3000Plus
Standard Resolution mode for resolution of 2+ ions at 13 000 amu/sec
Maximum Resolution mode for resolution of 3+ and 4+ ions at 1650 amu/sec
Standard Scan range 50-3000 m/z
Extended Scan range 200-6000 m/z at 27 000 amu/sec
   
QP2010 Ultra/SE Shimadzu
Resolution Standard resolution
Scan range 1.5-1090 m/z
max. Scan speed 10 000 amu/sec for the range m/z 60-660 with intervall 0.1 sec
   
TQ8040 Shimadzu
Resolution 1500
Scan range 10-1090 m/z
EI-Scan Sensitivity S/N>=600 for 1 pg Octafluoronaphthalene
MRM Sensitivity S/N>=4000 for 100 fg Octafluoronaphthalene
max. Scan speed 20 000 amu/sec (Q3 Scan)
   
MAT 95XP ThermoFinnigan
Resolution 60 000
Scan range > 3500 m/z
Scan cycle time 0.2 sec/decade
Accuracy < 2 ppm
   
MAT 8230 Finnigan
Resolution 10 000
Scan range up to 4200 m/z
Scan cycle time 5 sec/decade
   
6890/5973N Plus HP-MSD Agilent
Resolution Standard resolution
Scan range 1.6-800 amu in 0.1 amu steps
max. Scan speed 5200 amu/sec with 0.1 amu Resolution

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